| SR-AAS320N atomic absorption spectrophotometer has built-in computer data processing and LCD display, with reliable baseline stability. The optimally designed dual beam system can compensate for light source drift, wavelength drift caused by temperature changes (with the function of eliminating the effect of wavelength drift on baseline stability) and electronic circuit drift. The hollow cathode lamps do not require long time warm-up so sample can be analyzed immediately. |
WL range |
190-900nm |
WL accuracy |
≤±0.5nm |
WL repeatability |
≤0.3nm (single direction) |
Spectrum bandwidth |
0.2nm, 0.4nm, 0.7nm, 1.4nm, 2.4nm, 5.0nm |
Resolution |
<40% |
Base line stability |
±0.004Abs/30min |
Characteristic concentration of copper |
≤ 0.04μg/ml/1% |
Detection limit of copper |
≤0.008μg/ml |
Background calibration ability |
> 30 times |
RS232 |
available |
Printer |
optional |
Power supply |
220V 3A, 50Hz |